1. Ka nānā 'ana i ka haku mele 'ana: ke 'ano o ka nānā 'ana kemika, ke 'ano o ka ho'ā'o 'ana (mea kani CS infrared, ka spectrometer heluhelu pololei, zcP, etc.). ① Infrared CS mika: E noʻonoʻo i nā ferroalloys, nā mea hana kila, a me nā mea C a me S i ke kila. ②Ka helu helu helu pololei: C, Si, Mn, P, S, Cr, Mo, Ni, Cn, A1, W, V, Ti, B, Nb, As, Sn, Sb, Pb, Bi i nā laʻana nui. ③N-0 mika: ʻO kahi loiloi maʻiʻo kinoea o N a me O.

2. ʻO nā ana geometric paipu kila a me ka nānā ʻana i nā hiʻohiʻona:
① Nānā mānoanoa o ka pā paipu hao: micrometer, ana mānoanoa kani ultrasonic, ʻaʻole emi ma lalo o 8 mau helu ma nā wēlau ʻelua a hoʻopaʻa ʻia.
② ʻO ke anawaena o waho o ka paipu kila a me ka nānā ʻana i ka ovality: caliper, vernier caliper, apo apo, ana i ka palena kiʻekiʻe a me ka palena iki.
③Ka nānā ʻana i ka lōʻihi o ka paipu hao: ke ana lipine kila, ka manual a me ke ana lōʻihi.
④ Ka nānā ʻana i ka curvature paipu kila: E hoʻohana i ka lula, ka pae (1m), ka ʻike manaʻo, a me ka uea lahilahi e ana i ka curvature i kēlā me kēia mika a me ka curvature o ka lōʻihi holoʻokoʻa.
⑤ ʻO ka nānā ʻana i ke kihi bevel hope o ka paipu kila a me ka ʻaoʻao blunt: ruler square and clamping plate.

3. Nānā maikaʻi o ka ʻili paipu kila: 100%
① Nānā kiʻi lima: nā kūlana kukui, nā kūlana, ka ʻike, nā kaha, ka hoʻololi ʻana i ka paipu kila.
② ʻO ka nānā ʻana me ka luku ʻole: a. Ultrasonic flaw detection UT: He mea maʻalahi i ka ʻili a me nā hemahema o loko o nā mea like ʻole o nā mea like ʻole. Kūlana: GB/T 5777-1996. Papa: C5 pae.
b. ʻIke hewa ʻo Eddy i kēia manawa ET: (induction electromagnetic): ʻike nui ʻia i nā hemahema i ke ʻano kiko (ke ʻano puka). Kūlana: GB/T 7735-2004. Papa: B pae.
c. Mākēneki mākēneki MT a me ka magnetic flux leakage inspection: Magnetic inspection mea kūpono no ka ʻike ʻana i ka ʻili a me nā hemahema kokoke i ka ʻili o nā mea ferromagnetic. Kūlana: GB/T 12606-1999. Papa: C4 pae
d. Electromagnetic ultrasonic flaw detection: No coupling medium is required, and it can be applied to high-temperature, high-speed, rough steel pipe surface flaw detection.
e. ʻO ka hoʻāʻo Penetrant: fluorescence, kala, ʻike i nā hemahema o ka ʻili o nā paipu kila.

4. Nānā hana hoʻokele kila: ① Hoʻāʻo tensile: ana i ke koʻikoʻi a me ka deformation, a hoʻoholo i ka ikaika (YS, TS) a me ka helu plasticity (A, Z) o ka mea. Nā hiʻohiʻona lōʻihi a me ka transverse, nā ʻāpana paipu, nā ʻano arc a me nā ʻano pōʻai (￠10, ￠12.5). ʻO ke anawaena liʻiliʻi ka paipu kila lahilahi, ka paipu kila mānoanoa nui o ka paia, ka lōʻihi o ke ana. 'Ōlelo Aʻo: ʻO ka lōʻihi o ka hōʻailona ma hope o ka haʻihaʻi ʻana e pili ana i ka nui o ka specimen GB/T 1760.
②Ka ho'āʻo hopena: CVN, ʻano C-type, ʻano V, hana J waiwai J/cm2. Laʻana maʻamau 10×10×55 (mm) Lapana maʻamau ʻole 5×10×55 (mm)
③Hardness ho'āʻo: Brinell hardness HB, Rockwell hardness HRC, Vickers hardness HV, etc.
④Hydraulic ho'āʻo: ho'āʻo kaomi, kaomi hoʻopaʻa manawa, p=2Sδ/D

5. Steel paipu kaʻina hana nānā kaʻina hana:
① Hoʻāʻo palahalaha: ʻano poepoe ke ʻano C (S/D>0.15) H= (1+2)S/(∝+S/D)
L=40～100mm Koefficient Deformation no kēlā me kēia ʻāpana lōʻihi=0.07～0.08
② Ho'āʻo huki huki: L=15mm, ʻaʻohe māwae, ua kūpono
③Ka hoʻonui a me ka hoʻāʻo curling: ʻo 30 °, 40 °, 60 ° ka piko waena.
④Ka hoʻāʻo ʻana: hiki ke hoʻololi i ka hoʻāʻo palahalaha (no nā paipu anawaena nui)

6. Ke kālailai metallurgical o ka paipu kila:
①Nānā mana kiʻekiʻe (nānā microscopic): nā hoʻokomo ʻole metala 100x GB/T 10561 Ka nui o ka palaoa: papa, ʻokoʻa papa. Hui: M, B, S, T, P, F, AS. Papa decarburization: loko a me waho. Ka Papa Hana A: Papa A - sulfide, Papa B - oxide, Papa C - silicate, D - oxidation spherical, Papa DS.
②Ka ho'āʻo hoʻonui haʻahaʻa (macroscopic analysis): maka ʻōlohelohe, aniani hoʻonui 10x a i ʻole. a. ʻano hoʻāʻo etching acid. b. ʻO ke ʻano o ka nānā ʻana i ka paʻi Sulfur (ka nānā ʻana i ka tube blank, e hōʻike ana i nā hale haʻahaʻa a me nā hemahema, e like me ka looseness, segregation, subcutaneous bubbles, nā ʻili ʻili, nā kiko keʻokeʻo, inclusions, etc. c. Tower-shaped hairline inspection method: inspection of the number of lauoho lauoho, Length, and distribution.